Empirical density estimation and back-testing of Value at Risk (VaR) from parametric volatility models

dc.contributor.authorKimundi, Gillian
dc.date.accessioned2021-05-13T08:16:46Z
dc.date.available2021-05-13T08:16:46Z
dc.date.issued2017
dc.descriptionPaper presented at the 4th Strathmore International Mathematics Conference (SIMC 2017), 19 - 23 June 2017, Strathmore University, Nairobi, Kenya.en_US
dc.description.abstractThis paper forecasts one-day-ahead foreign exchange volatility using parametric models and compares their empirical forecasting performance of Value at Risk of five spot exchange rates; namely, the Kenyan Shilling versus the Euro, U.S. Dollar, Japanese Yen, Great British Pound and the South Africa Rand. Univariate GARCH family models (GARCH, E-GARCH, GARCH-M and FI-GARCH) are compared against the Discrete-time Stochastic Volatility Model. The daily mean exchange rates from January 2007 to December 2016 are used. Comparison analysis is divided into in-sample and out-of-sample forecasting performance which is evaluated using exceedance-based back-testing methods of conditional coverage, independence and unconditional coverage.en_US
dc.identifier.urihttp://hdl.handle.net/11071/11873
dc.language.isoenen_US
dc.publisherStrathmore Universityen_US
dc.subjectEmpirical density estimationen_US
dc.subjectBack-testingen_US
dc.subjectValue at Risk (VaR)en_US
dc.subjectParametric volatility modelsen_US
dc.titleEmpirical density estimation and back-testing of Value at Risk (VaR) from parametric volatility modelsen_US
dc.typeArticleen_US
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