Modeling a methodology for evaluation of wide area network technologies in Kenya.

dc.contributor.authorMirigi, Elias
dc.date.accessioned2011-07-12T11:07:02Z
dc.date.available2011-07-12T11:07:02Z
dc.date.issued2009
dc.descriptionPartial fulfillment for award of the degree of Masters of Science in Information Technology.en_US
dc.description.abstractData communication Networks are increasingly becoming a permanent feature in modern business organizations. Local Area Networks (LANs) Metropolitan Area Networks (MANs) and Wide Area Networks (WANs) have gained so much use and popularity in recent years that it is almost impossible to imagine an organization without them. While Local Area Networks provide abundant and reliable bandwidth at higher costs and with increased security threats. Due to their increasingly critical role in the business operations and the high associated costs, it is important that organizations make careful and informed decisions when selecting a WAN technology to sue. In particular, this decision must take into account the specific and unique needs and constraints an organizations to ensure that it gets the best value for this investment. While organization are clear on their specifics need, they are faced with a challenge of deciding which technology best represents the closest match to its unique needs. The aim of this study is to model scientific methodology which organizations can use to assist them in making this important decision. The use of this methodology will ensure that they make an informed decision on a proven and conventionally used scientific methodology. This will translate into more effectiveness and efficiency and hence more competitiveness and profitability in their operations.en_US
dc.identifier.citationTK5105.87.M57 2009en_US
dc.identifier.urihttp://hdl.handle.net/11071/1547
dc.language.isoenen_US
dc.publisherStrathmore Universityen_US
dc.subjectWANen_US
dc.subjectWAN evaluationen_US
dc.titleModeling a methodology for evaluation of wide area network technologies in Kenya.en_US
dc.typeThesisen_US
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